Study on temperature dependent resistivity of indium-doped cadmium zinc telluride
Identifieur interne : 000D21 ( Chine/Analysis ); précédent : 000D20; suivant : 000D22Study on temperature dependent resistivity of indium-doped cadmium zinc telluride
Auteurs : RBID : Pascal:09-0106417Descripteurs français
- Pascal (Inist)
- Wicri :
- concept : Dopage.
English descriptors
- KwdEn :
Abstract
Indium-doped CdZnTe crystals, grown by the modified vertical Bridgman method, were characterized by temperature dependent resistivity measurements in the range from 220 to 320 K. The Fermi level, pinned near the midgap, was confirmed by fitting ln(ρ) versus 1/k0T plots, giving energies of 0.63 eV and 0.72 eV above the valence band for the high resistivity samples, with doping levels of 5.0 x 1016 at cm-3 and 4.8 x 1017 at cm-3, respectively. Different dominant deep level defects or complexes for pinning the Fermi level, and hence producing high resistivity, were expected when comparing the charge transport behaviours of the materials and the dopant concentration. However, two energies of 0.24 eV and 0.33 eV, below the conduction band for the Fermi level, were calculated at positive and negative bias voltages, respectively, for a low resistivity sample doped by 9.7 x 1017 at cm-3 In.
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<author><name>YADONG XU</name>
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<affiliation wicri:level="1"><inist:fA14 i1="02"><s1>Department of Physics, University of Surrey</s1>
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<author><name>WANQI JIE</name>
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<author><name sortKey="Mills, Chris" uniqKey="Mills C">Chris Mills</name>
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<seriesStmt><idno type="ISSN">0022-3727</idno>
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Cadmium Zinc Tellurides Mixed</term>
<term>Complex defect</term>
<term>Deep level</term>
<term>Defect states</term>
<term>Doping</term>
<term>Electrical conductivity</term>
<term>Fermi level</term>
<term>IV characteristic</term>
<term>Impurity density</term>
<term>Indium additions</term>
<term>Temperature effects</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Effet température</term>
<term>Conductivité électrique</term>
<term>Dopage</term>
<term>Addition indium</term>
<term>Niveau Fermi</term>
<term>Caractéristique courant tension</term>
<term>Niveau profond</term>
<term>Etat défaut</term>
<term>Défaut complexe</term>
<term>Cadmium Zinc Tellurure Mixte</term>
<term>Concentration impureté</term>
</keywords>
<keywords scheme="Wicri" type="concept" xml:lang="fr"><term>Dopage</term>
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<front><div type="abstract" xml:lang="en">Indium-doped CdZnTe crystals, grown by the modified vertical Bridgman method, were characterized by temperature dependent resistivity measurements in the range from 220 to 320 K. The Fermi level, pinned near the midgap, was confirmed by fitting ln(ρ) versus 1/k<sub>0</sub>
T plots, giving energies of 0.63 eV and 0.72 eV above the valence band for the high resistivity samples, with doping levels of 5.0 x 10<sup>16</sup>
at cm<sup>-3</sup>
and 4.8 x 10<sup>17</sup>
at cm<sup>-3</sup>
, respectively. Different dominant deep level defects or complexes for pinning the Fermi level, and hence producing high resistivity, were expected when comparing the charge transport behaviours of the materials and the dopant concentration. However, two energies of 0.24 eV and 0.33 eV, below the conduction band for the Fermi level, were calculated at positive and negative bias voltages, respectively, for a low resistivity sample doped by 9.7 x 10<sup>17</sup>
at cm<sup>-3</sup>
In.</div>
</front>
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<fA11 i1="03" i2="1"><s1>SELLIN (Pall)</s1>
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<fA11 i1="05" i2="1"><s1>WEIHUA LIU</s1>
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<fA11 i1="06" i2="1"><s1>GANGQIANG ZHA</s1>
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<fA11 i1="07" i2="1"><s1>VEERAMANI (Perumal)</s1>
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<fA11 i1="08" i2="1"><s1>MILLS (Chris)</s1>
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<fC01 i1="01" l="ENG"><s0>Indium-doped CdZnTe crystals, grown by the modified vertical Bridgman method, were characterized by temperature dependent resistivity measurements in the range from 220 to 320 K. The Fermi level, pinned near the midgap, was confirmed by fitting ln(ρ) versus 1/k<sub>0</sub>
T plots, giving energies of 0.63 eV and 0.72 eV above the valence band for the high resistivity samples, with doping levels of 5.0 x 10<sup>16</sup>
at cm<sup>-3</sup>
and 4.8 x 10<sup>17</sup>
at cm<sup>-3</sup>
, respectively. Different dominant deep level defects or complexes for pinning the Fermi level, and hence producing high resistivity, were expected when comparing the charge transport behaviours of the materials and the dopant concentration. However, two energies of 0.24 eV and 0.33 eV, below the conduction band for the Fermi level, were calculated at positive and negative bias voltages, respectively, for a low resistivity sample doped by 9.7 x 10<sup>17</sup>
at cm<sup>-3</sup>
In.</s0>
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<s5>02</s5>
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<s5>02</s5>
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<s5>03</s5>
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<s5>03</s5>
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<s5>04</s5>
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<s5>04</s5>
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<s5>04</s5>
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<s5>05</s5>
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<s5>05</s5>
</fC03>
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<s5>06</s5>
</fC03>
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<s5>06</s5>
</fC03>
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<s5>07</s5>
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<s5>07</s5>
</fC03>
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<s5>08</s5>
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<s5>08</s5>
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<s5>09</s5>
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<s5>10</s5>
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<s5>10</s5>
</fC03>
<fC03 i1="10" i2="X" l="FRE"><s0>Cadmium Zinc Tellurure Mixte</s0>
<s2>NC</s2>
<s2>NA</s2>
<s5>11</s5>
</fC03>
<fC03 i1="10" i2="X" l="ENG"><s0>Cadmium Zinc Tellurides Mixed</s0>
<s2>NC</s2>
<s2>NA</s2>
<s5>11</s5>
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<fC03 i1="10" i2="X" l="SPA"><s0>Mixto</s0>
<s2>NC</s2>
<s2>NA</s2>
<s5>11</s5>
</fC03>
<fC03 i1="11" i2="X" l="FRE"><s0>Concentration impureté</s0>
<s5>13</s5>
</fC03>
<fC03 i1="11" i2="X" l="ENG"><s0>Impurity density</s0>
<s5>13</s5>
</fC03>
<fC03 i1="11" i2="X" l="SPA"><s0>Concentración impureza</s0>
<s5>13</s5>
</fC03>
<fN21><s1>075</s1>
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